TITLE:
Photoluminescence and Crystalline Properties of CuO-Ta2O5 Composite Films Prepared Using Co-Sputtering
AUTHORS:
Kenta Miura, Takumi Osawa, Yuya Yokota, Osamu Hanaizumi
KEYWORDS:
Ta2O5, CuO, Co-Sputtering, Photoluminescence, X-Ray Diffraction
JOURNAL NAME:
Open Access Library Journal,
Vol.2 No.11,
November
10,
2015
ABSTRACT:
We prepared CuO-Ta2O5 composite films by our simple
co-sputtering method using three CuO pellets and a Ta2O5 disc as a co-sputtering target, and subsequently annealed the films in ambient
air at 900℃, 1000℃, and 1100℃ for 20 min. We evaluated photoluminescence (PL) and X-ray diffraction
properties of the annealed films, and discussed the relationship between sharp
PL peaks (λ ~ 450 nm) observed from all the films and their crystallizabilities. We
considered that the 450-nm peaks originated from Cu2.1(Ta4O12)
crystal phases in the films.