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Photoluminescence and Crystalline Properties of CuO-Ta2O5 Composite Films Prepared Using Co-Sputtering

DOI: 10.4236/oalib.1102045    611 Downloads   831 Views  

ABSTRACT

We prepared CuO-Ta2O5 composite films by our simple co-sputtering method using three CuO pellets and a Ta2O5 disc as a co-sputtering target, and subsequently annealed the films in ambient air at 900℃, 1000℃, and 1100℃ for 20 min. We evaluated photoluminescence (PL) and X-ray diffraction properties of the annealed films, and discussed the relationship between sharp PL peaks (λ ~ 450 nm) observed from all the films and their crystallizabilities. We considered that the 450-nm peaks originated from Cu2.1(Ta4O12) crystal phases in the films.

Conflicts of Interest

The authors declare no conflicts of interest.

Cite this paper

Miura, K. , Osawa, T. , Yokota, Y. and Hanaizumi, O. (2015) Photoluminescence and Crystalline Properties of CuO-Ta2O5 Composite Films Prepared Using Co-Sputtering. Open Access Library Journal, 2, 1-5. doi: 10.4236/oalib.1102045.

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