Ludwig, R. and Dai, X. (1990) Numerical and Analytical Modeling of Pulsed Eddy Currents in a Conducting Half-Space. IEEE Transactions on Magnetics, 26, 299-307.
https://doi.org/10.1109/20.50558

has been cited by the following article:

• TITLE: Absolute Wall Thickness Measurement of Conducting Plates Using Pulsed Eddy Currents

  AUTHORS: Victor-O. de Haan, Riccardo Scottini

  KEYWORDS: Pulsed Eddy Currents, Wall Thickness, Absolute and Relative Measurements

  JOURNAL NAME: Journal of Electromagnetic Analysis and Applications, Vol.16 No.3, March 31, 2024

  ABSTRACT: The method using pulsed eddy currents to determine the thickness of a conduction plate is extended to enable the simultaneous measurement of the plate thickness and material properties. For optimal performance, a probe must be designed depending on the thickness range that should be accessible. The need for a calibration of the material properties of a conducting plate to enable the measurement of its thickness has been removed. All that is needed is a probe with known dimensions and suitable hardware to create a current pulse and measure a transient magnetic induction.