Article citationsMore>>

Gogotsi, Y.G., Domnich, V., Dub, S.N., Kailer, A. and Nickel, K.G. (2000) Cyclic Nanoindentation and Raman Microspectroscopy Study of Phase Transformations in Semiconductors. Journal of Materials Research, 15, 871-879.
https://doi.org/10.1557/JMR.2000.0124

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top