Article citationsMore>>

Li, M. M., Lai, J. Y., Chen, Q. L., Yi, Z. N., & Sun, X. D. (2018). Application Risk Evaluation of BIM Technology Based on SEM. Journal of Chongqing University of Technology (Natural Science), 32, 206-212.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top