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Yang, D.R., Lee, K.S., Ahn, H.J. and Lee, J.H. (2003) Experimental Application of a Quadratic Optimal Iterative Learning Control Method for Control of Wafer Temperature Uniformity in Rapid Thermal Processing. IEEE Transactions on Semiconductor Manufacturing, 16, 36-44.
https://doi.org/10.1109/TSM.2002.807740

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