Article citationsMore>>

Lanjouw, O.L., Pakes, A. and Putnam, J. (1998) How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data. The Journal of Industrial Economics, 46, 405-432. http://dx.doi.org/10.1111/1467-6451.00081

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top