Defect Detection in Manufacturing: An Integrated Deep Learning Approach

ISSN Print: 2327-5219
ISSN Online: 2327-5227
www.scirp.org/journal/jcc
E-mail: jcc@scirp.org

Citations

"Defect Detection in Manufacturing: An Integrated Deep Learning Approach"
written by Tewogbade Shakir Adeyemi,
published by Journal of Computer and Communications, Vol.12 No.10, 2024

has been cited by the following article(s):

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