JMP> Vol.3 No.5, May 2012

A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
A.I. Alikhanyan National Science Laboratory (YerPhI)
Institute of Metrology Republic of Armenia
Institute of Metrology Republic of Armenia
State Nuclear Safety Regulatory Committee by the Government of Armenia

 

Copyright © 2012 Hrant N. Yeritsyan, Aram A. Sahakyan, Sergey K. Nikoghosyan, Vachagan V. Harutyunyan, Karen Sh. Ohanyan, Norair E. Grigoryan, Eleonora A. Hakhverdyan, Aghasi S. Hovhannisyan, Vahan A. Sahakyan, Kamo A. Movsisyan, Artur V. Hovhannisyan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

---

H. Yeritsyan, A. Sahakyan, S. Nikoghosyan, V. Harutyunyan, K. Ohanyan, N. Grigoryan, E. Hakhverdyan, A. Hovhannisyan, V. Sahakyan, K. Movsisyan and A. Hovhannisyan, "In-Situ Study of Silicon Single Crystals Conductivity under Electron Irradiation," Journal of Modern Physics, Vol. 3 No. 5, 2012, pp. 383-387. doi: 10.4236/jmp.2012.35053.

 

Download citation as EndNote