Open Journal of Radiology
Vol.3 No.2(2013), Paper ID 33151, 10
pages
DOI:10.4236/ojrad.2013.32009
A GATE Simulation Study of the Siemens Biograph DUO PET/CT System
Dimitrios Nikolopoulos, Sofia Kottou, Nikolaos Chatzisavvas, Xenophon Argyriou, Emannouel Vlamakis, Panayiotis Yannakopoulos, Anna Louizi
Department of Physics, Chemistry and Material Science, Technological Educational Institute (TEI) of Piraeus,
Athens, Greece
Medical Physics Department, Medical School, University of Athens, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational
Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational
Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational
Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational
Institute (TEI) of Piraeus, Athens, Greece
Medical Physics Department, Medical School, University of Athens, Athens, Greece
Copyright © 2013 Dimitrios Nikolopoulos, Sofia Kottou, Nikolaos Chatzisavvas, Xenophon Argyriou, Emannouel Vlamakis, Panayiotis Yannakopoulos, Anna Louizi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
D. Nikolopoulos, S. Kottou, N. Chatzisavvas, X. Argyriou, E. Vlamakis, P. Yannakopoulos and A. Louizi, "A GATE Simulation Study of the Siemens Biograph DUO PET/CT System,"
Open Journal of Radiology, Vol. 3 No. 2, 2013, pp. 56-65. doi:
10.4236/ojrad.2013.32009.