Electrical and structural properties of nanocrystalline solids of C₈₀ fullerene encapsulated with a Lu₃N cluster, Lu₃N@C₈₀, have been studied by measuring x-ray photoemission spectra, x-ray diffraction, and current-voltage characteristics of the Lu₃N@C₈₀/Au Schottky contact in the temperature range of 300 - 500 K. The nanocrystalline solid sample of Lu₃N@C₈₀ fullerene consists of grains characterized with an fcc structure and those grains become larger in size after pressing the powder sample at 1.25 GPa. The current-voltage characteristics measured at various temperatures showed that there are no significant dependences on both the Schottky barrier and the carrier mobility on electric field. The Schottky barrier of the Lu₃N@C₈₀/Au contact is determined to be 0.71 ± 0.04 eV.