XANES and XPS Study on Microstructure of Mn-Doped ZnO Films

HTML  XML Download Download as PDF (Size: 983KB)  PP. 307-311  
DOI: 10.4236/msa.2013.45039    6,255 Downloads   10,224 Views  Citations

ABSTRACT

Microstructure of ZnO:Mn films with various Mn concentration was investigated with XANES and XPS. The experimental results revealed a substitution of Mn in ZnO and also excluded the existence of Mn oxides or metallic manganese clusters. The substitutional Mn presented a divalent state and all the ZnO:Mn films were n-type. Room temperature ferromagnetism monotonously decreases with the decrease of the electron carrier concentration. The observed ferrmagnetism should come from the carrier-mediated exchange.

Share and Cite:

B. Zhang, M. Li, J. Wang, L. Shi and H. Cheng, "XANES and XPS Study on Microstructure of Mn-Doped ZnO Films," Materials Sciences and Applications, Vol. 4 No. 5, 2013, pp. 307-311. doi: 10.4236/msa.2013.45039.

Copyright © 2024 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.