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Nano Phase Characterization by Transmission Electron Microscopy: Experimental and Simulation

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DOI: 10.4236/msa.2015.611094    2,788 Downloads   3,261 Views  


This paper introduces a methodology of characterization of nanostructured systems in which trans- mission electron microscopy is used as a central element of the study. Experimental studies of HREM are performed in parallel with studies in the Simula TEM program to stimulate high-resolution images and diffraction patterns. To confirm the accuracy of the results, studies of X-ray diffraction (XRD) were performed. In order to illustrate the methodology, bismuth oxide Bi2O3 nanoparticles are synthesized by a method of biosynthesis because this sample is rich in structural information.

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The authors declare no conflicts of interest.

Cite this paper

Aguirre, F. , Bazán-Díaz, L. , Mendoza-Cruz, R. , Gómez-Rodríguez, A. , Zorrilla-Cangas, C. and Herrera-Becerra, R. (2015) Nano Phase Characterization by Transmission Electron Microscopy: Experimental and Simulation. Materials Sciences and Applications, 6, 935-942. doi: 10.4236/msa.2015.611094.


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