Nano Phase Characterization by Transmission Electron Microscopy: Experimental and Simulation

Francisco Miguel Ascencio Aguirre¹, Lourdes Bazán-Díaz¹, Rubén Mendoza-Cruz¹, Alfredo Gómez-Rodríguez², Cristina Zorrilla-Cangas², Raúl Herrera-Becerra^2*

¹Posgrado en Ciencia e Ingeniería de Materiales, Instituto de Física, UNAM, Circuito de la Investigación Científica, Ciudad Universitaria, México, D.F., México.
²Departamento de Materia Condensada/Instituto de Física, UNAM, Circuito de la Investigación Científica, Ciudad Universitaria, México, D.F., México.

DOI: 10.4236/msa.2015.611094                

Abstract

This paper introduces a methodology of characterization of nanostructured systems in which trans- mission electron microscopy is used as a central element of the study. Experimental studies of HREM are performed in parallel with studies in the Simula TEM program to stimulate high-resolution images and diffraction patterns. To confirm the accuracy of the results, studies of X-ray diffraction (XRD) were performed. In order to illustrate the methodology, bismuth oxide Bi₂O₃ nanoparticles are synthesized by a method of biosynthesis because this sample is rich in structural information.

Keywords

Transmission Electron Microscopy, Nanoparticles, Bismuth Oxide Bi2O3

Conflicts of Interest

The authors declare no conflicts of interest.

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