J. M. EI-Hussaini and S. T. Stephenson, “Single-Crystal Orientation Effects in K X-Ray Absorption Spectra of Ge,” Physical Review, Vol. 109, No. 1, 1958, pp. 51-54. doi:10.1103/PhysRev.109.51

has been cited by the following article:

• TITLE: Optical Methods in Orientation of High-Purity Germanium Crystal

  AUTHORS: Guojian Wang, Yongchen Sun, Yutong Guan, Dongming Mei, Gang Yang, Angela Alanson Chiller, Bruce Gray

  KEYWORDS: Reflection Method; High-Purity Germanium Crystal

  JOURNAL NAME: Journal of Crystallization Process and Technology, Vol.3 No.2, April 30, 2013

  ABSTRACT: Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.