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has been cited by the following article:

• TITLE: Optical Methods in Orientation of High-Purity Germanium Crystal

  AUTHORS: Guojian Wang, Yongchen Sun, Yutong Guan, Dongming Mei, Gang Yang, Angela Alanson Chiller, Bruce Gray

  KEYWORDS: Reflection Method; High-Purity Germanium Crystal

  JOURNAL NAME: Journal of Crystallization Process and Technology, Vol.3 No.2, April 30, 2013

  ABSTRACT: Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals.