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P. Colombi, P. Zanola, E. Bontempi, R. Roberti, M. Gelfi and L. E. Depero, “Glancing-Incidence X-Ray Diffraction for Depth Profiling of Polycrystalline Layers,” Journal of Applied Crystallography, Vol. 39, Part 2, 2006, pp. 176- 179. doi:10.1107/S0021889805042779

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