Article citationsMore>>

P. R. Chidambaram, C. Bowen, S. Chakravarthi, C. Ma- chala and R. Wise, “Fundamentals of Silicon Material Properties for Successful Exploitation of Strain Engi- neering in Modern CMOS Manufacturing,” IEEE Trans- actions on Electron Devices, Vol. 53, No. 5, 2006, pp. 944-964. doi:10.1109/TED.2006.872912

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top