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H. Yanagisawa, T. Tamaki, M. Nakamura and K. Kudo, “Structural and Electrical Characterization of Pentacene Films on SiO2 Grown by Molecular Beam Deposition,” Thin Solid Films, Vol. 464-465, 2004, pp. 398-402. doi:10.1016/j.tsf.2004.06.065

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