Article citationsMore>>
S. H. Lo, D. A. Buchanan and Y. Taur, “Modeling and Characterization of Quantization, Polysilicon Depletion, and Direct Tunneling Effects in MOSFETs with Ultrathin Oxides,” IBM Journal of Research and Development, Vol. 43, No. 3, 1999, pp. 327-337. doi:10.1147/rd.433.0327
has been cited by the following article: