A. Poruba, A. Fejfar, Z. Remes, J. Springer, M. Vanecek, J. Kocka, J. Meier, P. Torres and A. Shah, “Optical Absorption and Light Scattering in Microcrystalline Silicon Thin Films and Solar Cells,” Journal of Applied Physics, Vol. 88, No. 1, 2000, pp. 148-160. doi:10.1063/1.373635

has been cited by the following article:

• TITLE: New Numerical Method to Calculate the True Optical Absorption of Hydrogenated Nanocrystalline Silicon Thin Films

  AUTHORS: Fatiha Besahraoui, Larbi Chahed, Yahia Bouizem, Jamal Dine Sib

  KEYWORDS: Solution Hydrogenated Nanocrystalline Silicon; Constant Photocurrent Method; Optical Absorption; Bulk Light Scattering; Surface Roughness; Film Thickness

  JOURNAL NAME: World Journal of Nano Science and Engineering, Vol.2 No.1, March 28, 2012

  ABSTRACT: The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient from CPM absorption spectra of nanotextured nano-crystalline silicon films. Bulk and surface light scattering contributions can be unified through the correlation obtained between the scattering coefficient and surface roughness obtained using our method.