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has been cited by the following article:

• TITLE: New Numerical Method to Calculate the True Optical Absorption of Hydrogenated Nanocrystalline Silicon Thin Films

  AUTHORS: Fatiha Besahraoui, Larbi Chahed, Yahia Bouizem, Jamal Dine Sib

  KEYWORDS: Solution Hydrogenated Nanocrystalline Silicon; Constant Photocurrent Method; Optical Absorption; Bulk Light Scattering; Surface Roughness; Film Thickness

  JOURNAL NAME: World Journal of Nano Science and Engineering, Vol.2 No.1, March 28, 2012

  ABSTRACT: The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient from CPM absorption spectra of nanotextured nano-crystalline silicon films. Bulk and surface light scattering contributions can be unified through the correlation obtained between the scattering coefficient and surface roughness obtained using our method.