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Chang, M., Chen, C., Hsueh, C.H., Hsieh, W.J., Yen, E., Ho, K.L., et al. (2015) The Reliability Investigation of PV Junction Box Based on 1GW Worldwide Field Database. 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), New Orleans, 14-19 June 2015, 1-4.
https://doi.org/10.1109/PVSC.2015.7356130

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