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Sun, B. and Ma, L. (2020) An Overview of Outliers and Detection Methods in General for Time Series from IoT Devices. In: Liu, Q., Liu, X.D., Shen, T. and Qiu, X.S., Eds., The 10th International Conference on Computer Engineering and Networks, Springer, 1180-1186.
https://doi.org/10.1007/978-981-15-8462-6_135

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