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Peng, W., Hao, Z., Yapeng, J., Kun, Y. and Weihao, L. (2020) Removal of the Single Point Diamond Turning Marks by Spiral Sine Trace Bonnet Polishing Process. InfraRed and Laser Engineering, 49, 20200212-1. https://doi.org/10.3788/IRLA20200212

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