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https://doi.org/10.1021/acs.jpclett.5b02099

has been cited by the following article:

• TITLE: Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films

  AUTHORS: Nam Joong Jeon, Jangwon Seo, Yanghee Kim, Ji Yeong Lee, Sugyeong Hong, Sun Hee Kim, Jung-Keun Lee

  KEYWORDS: Perovskite Manganites, FIB, Paramagnetic Spins

  JOURNAL NAME: Advances in Chemical Engineering and Science, Vol.12 No.2, March 24, 2022

  ABSTRACT: FAMn:PbI3 perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI3 with low (~1%) Mn concentration showed a hyperfine sextet line originated from Mn++ ions. FAMn:PbI3 with high (10%) Mn concentration showed broad resonance (~500 G peak-to-peak linewidth). However, after bombardment of FAMn:PbI3 with high Mn concentration by focused ion beams (FIB), a sharp ESR peak appeared. The peak-to-peak linewidth (ΔHpp) was ~8 G regardless of the temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K - 50 K), which indicates the presence of localized electrons at the defect sites at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the temperature increased from 5 K to 50 K. Together with the ongoing search for electron spin echo (ESE), this could potentially provide a platform for realizing magnetic bits, information storage, and increased manipulation speed.