Article citationsMore>>

Hamelmann, F., Gesheva, K., Ivanova, T., Szekeres, A., Abroshev, M. and Heinzmann, U. (2005) Optical and Electrochromic Characterization of Multilayered Mixed Metal Oxide Thin Films. The Journal of Optoelectronics and Advanced Materials, 7, 393-399.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2025 Scientific Research Publishing Inc. All Rights Reserved.
Top