Article citationsMore>>

S. K. O’Leary, B. E. Foutz, M. S. Shur and L. F. Eastman, “Steady-State and Transient Electron Transport within the III–V Nitride Semiconductors, GaN, AlN, and InN: A Review,” Journal of Material Science: Materials in Electronics, Vol. 17, No. 2, 2006, pp. 87-126. doi:10.1007/s10854-006-5624-2

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2025 Scientific Research Publishing Inc. All Rights Reserved.
Top