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Tsuno, M., Suga, M., Tanaka, M., Shibahara, K., Miura-Mattausch, M. and Hirose, M. (1999) Physically-Based Threshold Voltage Determination for MOSFETs of All Gate Lengths. IEEE Transactions on Electron Devices, 46, 1429-1434.
https://doi.org/10.1109/16.772487

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