Article citationsMore>>

R. Ferre, I. Martín, M. Vetter, M. Garín and R. Alcubilla, “Effect of Amorphous Silicon Carbide Layer Thickness on the Passivation Quality of Crystalline Silicon Surface,” Applied Physics Letters, Vol. 87, No. 20, November 2005, pp. 109-202. doi.10.1063/1.2130530

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2025 Scientific Research Publishing Inc. All Rights Reserved.
Top