TITLE:
Influence of Deformation on CVC p-n-Junction in a Strong Microwave Field
AUTHORS:
Muhammadjon Gulomkodirovich Dadamirzayev
KEYWORDS:
Microwave Electromagnetic Field, Deformation Effects in Semiconductors, The Concentration of Minority Carriers, The Current-Voltage Characteristic of the p-n-Junction, The Temperature of the Electrons and Holes
JOURNAL NAME:
Journal of Modern Physics,
Vol.6 No.2,
February
25,
2015
ABSTRACT: This paper investigates the current-voltage
characteristics (CVC) strain of p-n-junction in a strong microwave (MW) field
and shows that the deformation increases the current generated in the p-n-junction.
We analyze the current-voltage characteristics of p-n-junction in which three-dimensional
space (I,U,e) gives more complete information than the
two-dimensional.