TITLE:
An IEEE 1149.x Embedded Test Coprocessor
AUTHORS:
Ukbagiorgis Iyasu Gebremeskel, José Manuel Martins Ferreira
KEYWORDS:
Built-In Test, Boundary-Scan, Embedded Coprocessors, MicroBlaze, IEEE 1149.1, IEEE 1149.7
JOURNAL NAME:
Circuits and Systems,
Vol.5 No.7,
July
23,
2014
ABSTRACT: This paper describes a microprogrammed architecture for an embedded
coprocessor that is able to control IEEE 1149.1 to IEEE 1149.7 test
infrastructures, and explains how to expand the supported test command set. The
coprocessor uses a fast simplex link (FSL) channel to interface a 32-bit
MicroBlaze CPU, but it can work with any microprocessor core that accepts this
simple FIFO-based interface method. The implementation cost (logic resource
usage for a Xilinx Spartan-6 FPGA) and the performance data (operating
frequency) are presented for a test command set comprising two parts: 1) the
full IEEE 1149.1 structural test operations; 2) a subset of IEEE 1149.7
operations selected to illustrate the implementation of advanced scan formats.