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Ohshita, Y., Oshida, M., Seki, M. and Watanabe, K. (1998) TiSi2/Si Interface Instability in Plasma-Assisted Chemical Vapor Deposition of Titanium. Journal of Crystal Growth, 193, 322-327.
http://dx.doi.org/10.1016/S0022-0248(98)00490-4

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