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R. S. Winburn, D. G. Grier, G. J. McCarthy and R. B. Peterson, “Rietveld Quantitative X-Ray Diffraction Analysis of NIST Fly Ash Standard Reference Materials,” Powder Diffraction, Vol. 15, No. 3, 2000, pp. 163-172. http://dx.doi.org/10.1017/S0885715600011015

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