Article citationsMore>>

K. Xiong, J. Robertson and S. J. Clark, “Defect States in the High-Dielectric-Constant Gate Oxide LaAlO3,” Applied Physics Letters, Vol. 89, No. 2, 2006, Article ID: 022907. doi:10.1063/1.2221521

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top