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Q. Kong, L. Ji, H. Li, X. Liu, Y. Wang, J. Chen and H. Zhou, “Influence of Substrate Bias Voltage on the Microstructure and Residual Stress of CrN Films Deposited by Medium Frequency Magnetron Sputtering,” Materials Science and Engineering B, Vol. 176, No. 11, 2011, pp. 850-854. doi:10.1016/j.mseb.2011.04.015

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