Article citationsMore>>

B. Warcholinski, A. Gilewicz, J. Ratajski, Z. Kuklinski and J. Rochowicz, “An Analysis of Macroparticle-Related Defects on CrCN and CrN Coatings in Dependence of the Substrate Bias Voltage,” Vacuum, 2011, in press. doi:10.1016/j.vacuum.2011.04.023

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top