TITLE:
A New Result on Regular Designs under Baseline Parameterization
AUTHORS:
Mengru Qin, Yuna Zhao
KEYWORDS:
Baseline Parameterization, K-Aberration, Regular Design, Word Length Pattern
JOURNAL NAME:
Open Journal of Applied Sciences,
Vol.14 No.2,
February
29,
2024
ABSTRACT: The study on
designs for the baseline parameterization has aroused attention in recent
years. This paper focuses on two-level regular designs for the baseline
parameterization. A general result on the relationship between K-aberration and word length
pattern is developed.