Article citationsMore>>
Garb, K. and Obermaier, J. (2020) Temporary Laser Fault Injection into Flash Memory: Calibration, Enhanced Attacks, and Countermeasures. 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), Napoli, 13-15 July 2020, 1-7.
https://doi.org/10.1109/IOLTS50870.2020.9159712
has been cited by the following article:
Related Articles:
-
Jaykov Foukzon
-
Etobo Innocent Ahounou, Kouadio Raymond N’Guessan, Rita Ahou Aka, Dion Aristide Gonce, Gnonsian Estelle Gahy, Yessonguilana Jean-Marie Yeo-Tenena
-
Zhebin Sun, Kang Li, Zhile Yang, Qun Niu, Aoife Foley
-
Aboudou Raïmi Kpossou, Djima Patrice Dangbemey, Véronique Mèdessè Tognifodé, Barnard Acakpo, Jean Sehonou, Josiane Angeline Tonato Bagnan
-
Athanasios Anastasiou, Pasiopoulou Marietta