Article citationsMore>>

Belyaev, A., Marinskiy, D., Wilson, M., D’Amico, J., Jastrzeski, L. and Lagowski, J. (2007) Application of Non-Contact Corona-Kelvin Metrology for Characterization of Plasma Nitrided SiO2. AIP Conference Proceedings, 931, 270-274.
https://doi.org/10.1063/1.2799382

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top