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Ingham, B. and Toney, M.F. (2014) X-Ray Diffraction for Characterizing Metallic Films. In: Barmak, K. and Coffey, K., Eds., Metallic Films for Electronic, Optical and Magnetic Applications, Woodhead Publishing, Cambridge, 3-38.
https://doi.org/10.1533/9780857096296.1.3

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