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Schulze, M., Damm, M., Helgert, M., Kley, E.B., Nolte, S. and Tünnermann, A. (2012) Durability of Stochastic Antireflective Structures-Analyses on Damage Thresholds and Adsorbate Elimination. Optics Express, 20, 18348-18355.
https://doi.org/10.1364/OE.20.018348

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