Korhonen, M.A., Borgesen, P., Tu, K.N. and Li, C.Y. (1993) Stress Evolution Due to Electromigration in Confined Metal Lines. Journal of Applied Physics, 73, 3790-3799.
https://doi.org/10.1063/1.354073

has been cited by the following article:

• TITLE: Enhancement of Effective Accumulation of Atoms during Fabrication of Al Microsphere

  AUTHORS: Faizul Mohammad Kamal, Md. Nazrul Islam Khan

  KEYWORDS: Electromigration, Atoms, Migration, Microsphere, Accumulation

  JOURNAL NAME: Microscopy Research, Vol.7 No.4, October 31, 2019

  ABSTRACT: Microspheres of Al have been successfully fabricated utilizing electromigration using sudden change in geometrical shape of a specimen. The experimental sample was a passivated Al line with a hole at the transitional area of the sample. The hole was used to control the accumulation and discharge process. The formation of the microsphere is enhanced by controlling temperature and current density. The atomic flux was increased with the increasing current density that was happened along the electron flow direction in the small region at the geometrical shape of the sample.