Article citationsMore>>

Österle, W., Rooch, H., Pyzalla, A. and Wang, L. (2001) Investigation of White Etching Layers on Rails by Optical Microscopy, Electron Microscopy, X-Ray and Synchrotron X-Ray Diffraction. Materials Science and Engineering A, 303, 150-157.
https://doi.org/10.1016/S0921-5093(00)01842-6

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top