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Hu, H., Novo, C., Funston, A., Wang, H., Staleva, H., Zou, S., Mulvaney, V., Xiae, Y. and Hartland, G.V. (2008) Dark-Field Microscopy Studies of Single Metal Nanoparticles: Understanding the Factors That Influence the Line Width of the Localized Surface Plasmon Resonance. Journal of Materials Chemistry, 18, 1949-1960.
https://doi.org/10.1039/b714759g

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