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Bhushan, B. and Othmar, M. (2011) Scanning Probe Microscopy—Principle of Operation, Instrumentation, and Probes. In: Bhushan, B., Ed., Nanotribology and Nanomechanics I, Springer Berlin, Heidelberg, 37-110.
http://dx.doi.org/10.1007/978-3-642-15283-2_2

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