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Leitner, T., Feiningstein, A., Turchetta, R., Coath, R., Chick, S., Vi-sokolov, G., Savuskan, V., Javitt M., Gal, L., Brouk, I., Bra-Lev, S. and Nemirovsky, Y. (2013) Measurements and Simulations of Low Dark Count Rate Single Photon Avalanche Diode Device in a Low Voltage 180-nm CMOS Image Sensor Technology. IEEE Transactions on Electron Devices, 60, 1982-1988. https://doi.org/10.1109/TED.2013.2259172

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