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Chabloz, M., Jiao, J., Yoshida, Y., Matsuura, T. and Tsutsumi, K. (2000) A Method to Evade Microloading Effect in Deep Reactive Ion Etching for Anodically Bonded Glass-Silicon Structures. MEMS 2000 0-7803-5273-4/00, 283-287.
http://dx.doi.org/10.1109/memsys.2000.838530

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