Author(s): |
Ni-Na Zhou, Department Electronics & Electronic Engineering, Baoji University of Arts & Science , Baoji, China Weixin Li, Department Electronics & Electronic Engineering, Baoji University of Arts & Science , Baoji, China Jing Sun, Department Electronics & Electronic Engineering, Baoji University of Arts & Science , Baoji, China Suogang Shi, Department Electronics & Electronic Engineering, Baoji University of Arts & Science , Baoji, China Ni-Na Zhao, Department Electronics & Electronic Engineering, Baoji University of Arts & Science , Baoji, China |