Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line
Navjot Kaur Dhillon, Harcharan Singh Dhaliwal
DOI: 10.4236/ajps.2011.23049   PDF    HTML     5,316 Downloads   10,817 Views   Citations


Sixty-five random amplified polymorphic DNA (RAPD) primers were used for the detection of polymorphism among recipient and donor parents and their isogenic lines linked to leaf rust resistance genes, Lr9 and the resistant gene in kharchia local mutant KLM4-3B. Three primers showed polymorphism among recurrent parent, donor parent and isogenic lines.

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Dhillon, N. and Dhaliwal, H. (2011) Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line. American Journal of Plant Sciences, 2, 433-437. doi: 10.4236/ajps.2011.23049.

Conflicts of Interest

The authors declare no conflicts of interest.


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